OpenIoT & ELC Europe 2016

Most embedded systems developers are aware that NAND flash isn't entirely reliable, and have heard of erase cycles, read disturb, retention time, paired pages, ECC, wear levelling etc. However, few understand why things go wrong. This talk will correct that. We start by looking at how a flash cell operates. This will give us an understanding of why the wrong bit may be read from it. Then we can look at how the faults can be mitigated. Finally we can think about how all this will evolve in the future.